#Xsort belmont software#
#Xsort belmont plus#

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For information regarding permissions, request forms and the appropriate contacts within the Pearson Education Global Rights & Permissions department, please visit Attributions of third party content appear on page 752, which constitutes an extension of this copyright page. This publication is protected by copyright, and permission should be obtained from the publisher prior to any prohibited reproduction, storage in a retrieval system, or transmission in any form or by any means, electronic, mechanical, photocopying, recording, or otherwise. Watt/Getty Images Field Marketing Assistant Erin RushĬopyright © 2018, 2014, 2010 by Pearson Education, Inc. Product Marketing Assistant Jennifer Myers Senior Author Support/ Technology Specialist Joe Vetere Manager, Rights and Permissions Gina Cheselka Text and Cover Design, Illustrations Production Coordination, Composition Cenveo Publisher Services Cover Image: © Laura A. TRIOLA Special Contributions by Laura lossi, Broward Collegeĭirector, Portfolio Management Deirdre Lynch Senior Portfolio Manager Suzy Bainbridge Portfolio Management Assistant Justin Billing Content Producer Peggy McMahon Managing Producer Karen Wernholm Manager, Courseware QA Mary Durnwald Manager, Content Development Robert Carroll Senior Producer Vicki Dreyfus Product Marketing Manager Tiffany Bitzel Field Marketing Manager Andrew Noble Large surface area SDDs (silicon drift detectors) come standard in all xSORT handheld instruments, assuring that you get the best value available in handheld XRF instrumentation.Chapter 2: Exploring Data with Tables and GraphsĬhapter 3: Describing, Exploring, and Comparing DataĤ-2 Addition Rule and Multiplication RuleĤ-3 Complements, Conditional Probability, and Bayes’ TheoremĬhapter 5: Discrete Probability DistributionsĬhapter 6: Normal Probability DistributionsĬhapter 7: Estimating Parameters and Determining Sample SizesĬhapter 11: Goodness-of-Fit and Contingency TablesĪppendix C: Websites and Bibliography of BooksĮLEMENTARY STATISTICS MARIO F. Light element analysis (Mg, Al, Si, P, S) without helium of vacuum purge for ultimate portability

#Xsort belmont software#

Real-time elemental analysis results on the job, no matter where the job takes placeĮxcellent software for data reporting and evaluation Distinct benefits of SPECTRO xSORT handheld XRF analyzers include: Giving you fast elemental analysis results is what the xSORT is all about. The SPECTRO xSORT is a compact handheld XRF analyzer (ED-XRF spectrometer) that covers a broad range of materials in widely varying locations, environments, and conditions. SPECTRO xSORT Handheld XRF Analyzer Benefits Precious Metals Analysis / Precious Metals Assay With accuracy previously unseen in a handheld XRF instrument, the SPECTRO xSORT is the right tool for a number of analysis needs including:Īlloy Analysis, Metal Sorting, Scrap Sorting

Widely used in industry and research alike, SPECTRO handheld XRF Analyzers provide quantitative elemental analysis of approximately 80 elements, ranging from Mg (magnesium) to U (uranium). Handheld XRF Analyzers from SPECTRO-a world leader in elemental analysis technologies-are robust, accurate tools for elemental analysis of virtually any material. Also available is an integrated global positioning system (GPS) that allows users to quickly return to previously checked locations without time-wasting resurveys. The new SPECTRO xSORT also is available with time and cost-saving features, such as an integrated video camera for precise spot testing and visual memory storage. And, for more complex matrices such as in environmental screening, SPECTRO xSORT achieves very low detection limits without the need for complex sample preparation.

#Xsort belmont plus#

SPECTRO xSORT is ideal for applications, including positive material identification (PMI) and environmental screening, recycling of alloys, precious metals, and aluminum, plus mining and compliance screening.įor many jobs, such as material verification, SPECTRO xSORT delivers highly reliable analyses in two seconds. Its speed, accuracy and ease of use set new benchmarks for handheld spectrometric performance. The new SPECTRO xSORT is designed for high-throughput elemental testing and spectrochemical analysis of a wide range of metals and other materials in the field.